Our Vision
is to optimize advanced manufacturing using our proprietary multiplexed metrology and sensing technologies to train advanced AI algorithms for real-time process monitoring and control to achieve zero yield loss.
CEO
Clare is the Owner and Co-Founder of Layer Metrics Inc.
She is an entrepreneur and business woman with experience in Optics and Photonics Industry Start-ups, commercializing in-line optical monitoring instruments.
Successes Include
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ASTM ICAM Invited Speaker
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Hexagon Manufacturing Intelligence Sixth Sense Finalist
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Luminate Cohort IV Finalists and Audience Choice Award
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PRISM Award Finalist
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Pittcon Award Winner
CTO
Dom is the Co-Founder of Layer Metrics Inc.
He is an Opto-Photonic, Sensing and Metrology Expert, with 25+ years experience. He innovates, develops and commercializes in-line optical monitoring instruments.
He is an invited presenter and panelist at multiple international conferences and an
author on multiple international journal and patent publications.
Successes Include
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Hexagon Manufacturing Intelligence Sixth Sense Finalist
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Luminate Cohort IV Finalists and Audience Choice Award
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BRINC International Finalist
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PRISM Award Finalist
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Nature Featured Product
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LFW and OPN Featured Articles
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Pittcon Award Winner
We are supported by a Team of Advanced Manufacturing & Opto-Photonic Sensing and Metrology Industry Experts, Advisors and Partners.
Timeline
Layer Metrics Inc.
